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The formula for finding errors or defects remaining after the test is as follows;

N-n = n X ( S - s ) / s

Where N is the total number of errors 

n is the number found by testing 120

S is the total number of seeded defects 400

s is the number of seeded defects found during testing 240

120 x ( 400 - 240 ) / 240

120 x ( 160) / 240 = 80.


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